Reliability and Failure of Electronic Materials and Devices

von James R. Lloyd, Milton Ohring, Lucian Kasprzak

760 Seiten, Hardcover

Kurzbeschreibung des Verlags

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices.

• Reihe: Academic Press
• ISBN: 9780120885749
• Sprache: Englisch
• Erscheinungsdatum: 24.10.2014
• Größe: 236 x 158 mm
• Verlag: Elsevier Inc