Hot-Carrier Effects in Mos Devices

von Eiji Takeda, Akemi Miura-Hamada, Cary Y. Yang

328 Seiten, Hardcover

Kurzbeschreibung des Verlags

The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world. This book is derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However, the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.

• Reihe: Elsevier
• ISBN: 9780126822403
• Sprache: Englisch
• Erscheinungsdatum: 19.11.1995
• Größe: 229 x 152 mm
• Verlag: Elsevier Inc