Atom Probe Tomography

Put Theory Into Practice

418 Seiten, Hardcover

Kurzbeschreibung des Verlags

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process.

• Reihe: Academic Press
• ISBN: 9780128046470
• Sprache: Englisch
• Erscheinungsdatum: 02.06.2016
• Größe: 236 x 156 mm
• Verlag: Elsevier Inc
• Herausgegeben von: Francois Vurpillot, Williams Lefebvre, Xavier Sauvage