ESD Program Management

A Realistic Approach to Continuous Measurable Improvement in Static Control

von G. Theodore Dangelmayer

472 Seiten, Hardcover

Kurzbeschreibung des Verlags

This is a revision of the highly successful electronic manufacturing guide, ESD Program Management: A Realistic Approach to ContinuousMeasurable Improvement in Static Control . This revision is comprehensive and explains how to develop, implement and manage an ESD control program, and includes up-to-date data, many new chapters, new case studies, and much more. New to this edition:

Extensive changes and additions to auditing techniques, cost benefits data, and materials evaluation.

Six new chapters on common myths, issues related to smaller companies, process controls, ISO 9000, material characterization, and training.

New case studies on field-induced failures in the factory, long-distance central office system upsets, and automation-caused failures.

Expanded coverage of the needs of smaller companies including discussion of common problems and cost-effective solutions. A training breakthrough is presented. Previously invisible ESD events can now be easily displayed for students at all levels - `Seeing is believing!'

Inclusion of new testing instruments such as the event detector and resistance probe.

The 12 critical factors in an ESD program have been updated to reflect changes and refinements in program management.

The author has also included the latest information on handling procedures and requirements from the Lucent ESD Control Handbook. ESD Program Management: A Realistic Approach to Continuous MeasurableImprovement in Static Control, Second Edition, is a refreshingly unbiased guide for electronic manufacturing and quality control professionals.

• Reihe: The Springer International Series in Engineering and Computer Science
• Themen: Technologie, Ingenieurswissenschaft, Landwirtschaft, Industrieprozesse Maschinenbau und Werkstoffe Fertigungstechnik und Ingenieurwesen
• ISBN: 9780412136719
• Sprache: Englisch
• Erscheinungsdatum: 31.01.1999
• Größe: 23.4 x 15.6 cm
• Verlag: Springer US