Microelectronic Reliability

Integrity Assessment and Assurance

von Emiliano Pollino

556 Seiten, Hardcover

Kurzbeschreibung des Verlags

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi