Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs

von Robert Anholt

324 Seiten, Hardcover

Kurzbeschreibung des Verlags

This work provides a comprehensive discussion of the bias dependence of equivalent circuit parameters for the three devices and an extensive discussion of temperature dependence. It: covers recess-etched MESFETs and self-aligned MESFETs with and without lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP lattice-matched HEMT equivalent circuits; and describes a large-signal, temperature-dependent model extractor for A1GaAs-GaAs HBTs. The book is intended for circuit designers, process and device developers and test engineers.

• ISBN: 9780890067499
• Sprache: Englisch
• Erscheinungsdatum: 30.11.1994
• Größe: 237 x 160 mm
• Verlag: Artech House Publishers