Heteromagnetic Microelectronics

Microsystems of Active Type

von Alexander V Lyashenko, Alexander a Ignatiev

506 Seiten, Hardcover

Kurzbeschreibung des Verlags

The book proposed to the readers' attention represents an attempt to state and systematize extensive material of our experimental and theoretical investigations of heteromagnetic interactions in ferrite semiconductor structures of the active type carried out at the department of general physics, Saratov State University named after N.G. Chernyshevskiyandin the Design of ceof critical technologies(DO CT) of SRI-Tantal Corp. of the Holding company "Tantal" in recent years. The novelty and complexity of the physical phenomena determined the high-technologychar- ter ofourinvestigationsat the jointof someleads- semiconductormicroelectronics, microcircuitry, radio engineering, radiophysics, physics of magnetic phenomena, magnetoelectronics. Accumulation of extensive theoretical and experimental material on mag- toelectronics of the microwave and EHF-ranges, investigations on bigyrotropic microelectronics in ferrite lms and structures on their basis, decisive experiments con rming the multifunctionality of interactions in ferrite semiconductor structures of the active type have determined the new lead being promising. The results of our physical investigations of multifunctional, multiparametric interactions in ferrite semiconductorstructures of the active type - (oscillators, c- verters, ampli ers, frequencysynthesizers, and sensors) in the radio-wave range are discussed in the book. Performance of such a great volume of investigations became possible by jo- ing the efforts of leading experts and scientists of Saratov State University, leading industrial enterprises of Russia in the spheres of semiconductor microelectr- ics manufacturing, development of microcontrollers, radioelectronic systems, and ferrites.

• Themen: Mathematik und Naturwissenschaften Physik Elektrizität, Magnetismus und Elektromagnetismus
• ISBN: 9781441960016
• Sprache: Englisch
• Erscheinungsdatum: 21.09.2010
• Größe: 241 x 167 mm
• Verlag: Springer New York