Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

588 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. 

• Reihe: Image Processing, Computer Vision, Pattern Recognition, and Graphics
• Themen: Informatik und Informationstechnologie Informatik Künstliche Intelligenz (KI)
• ISBN: 9783319490540
• Sprache: Englisch
• Erscheinungsdatum: 05.11.2016
• Größe: 23.5 x 15.5 cm
• Verlag: Springer International Publishing
• Herausgegeben von: Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson