Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings

524 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods. 

• Reihe: Image Processing, Computer Vision, Pattern Recognition, and Graphics
• Themen: Informatik und Informationstechnologie Informatik Künstliche Intelligenz (KI)
• ISBN: 9783319977843
• Sprache: Englisch
• Erscheinungsdatum: 02.08.2018
• Größe: 23.5 x 15.5 cm
• Verlag: Springer International Publishing
• Herausgegeben von: Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly