Decision Patterns on Software Metrices for Single& Multiple Projects

von Nageswara Rao Moparthi, P. Vidhya Sagar, S. Satyanarayana

200 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns.

• Themen: Informatik und Informationstechnologie Allgemeine Themen
• ISBN: 9783330049550
• Sprache: Englisch
• Erscheinungsdatum: 23.02.2017
• Größe: 220 x 150 mm
• Verlag: LAP LAMBERT Academic Publishing