X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

von Martin Schmidbauer

204 Seiten, Hardcover

Kurzbeschreibung des Verlags

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

• Reihe: Springer Tracts in Modern Physics
• Themen: Mathematik und Naturwissenschaften Physik Elektrizität, Magnetismus und Elektromagnetismus
• ISBN: 9783540201793
• Sprache: Englisch
• Erscheinungsdatum: 09.01.2004
• Größe: 23.5 x 15.5 cm
• Verlag: Springer Berlin