Model Checking Software

12th International SPIN Workshop, San Francisco, CA, USA, August 22-24, 2005, Proceedings

304 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

Invited Talks/Papers.- Pushdown Model Checking for Security.- Execution Generated Test Cases: How to Make Systems Code Crash Itself.- Invited Tutorials.- Effective Bug Hunting with Spin and Modex.- The BLAST Software Verification System.- Model Checking Programs with Java PathFinder.- State Representation and Abstraction.- An Incremental Heap Canonicalization Algorithm.- Memory Efficient State Space Storage in Explicit Software Model Checking.- Counterexample-Based Refinement for a Boundedness Test for CFSM Languages.- Dealing with Concurrency.- Symbolic Model Checking for Asynchronous Boolean Programs.- Improving Spin's Partial-Order Reduction for Breadth-First Search.- Sound Transaction-Based Reduction Without Cycle Detection.- Dealing with Complex Data.- Repairing Structurally Complex Data.- Crafting a Promela Front-End with Abstract Data Types to Mitigate the Sensitivity of (Compositional) Analysis to Implementation Choices.- Behavioural Models for Hierarchical Components.- Checking Temporal Properties.- On-the-Fly Emptiness Checks for Generalized Büchi Automata.- Stuttering Congruence for ?.- Verifying Pattern-Generated LTL Formulas: A Case Study.- Checking Security and Real-Time Properties.- Generic Verification of Security Protocols.- Using SPIN and Eclipse for Optimized High-Level Modeling and Analysis of Computer Network Attack Models.- Model Checking Machine Code with the GNU Debugger.- Tool Papers.- Etch: An Enhanced Type Checking Tool for Promela.- Enhanced Probabilistic Verification with 3Spin and 3Murphi.- SPLAT: A Tool for Model-Checking and Dynamically-Enforcing Abstractions.- Learning-Based Assume-Guarantee Verification (Tool Paper).

• Reihe: Lecture Notes in Computer Science
• Themen: Informatik und Informationstechnologie Informatik Theoretische Informatik
• ISBN: 9783540281955
• Sprache: Englisch
• Erscheinungsdatum: 09.08.2005
• Größe: 235 x 155 mm
• Verlag: Springer
• Herausgegeben von: Patrick Godefroid