Positron Annihilation in Semiconductors

Defect Studies

von Reinhard Krause-Rehberg, Hartmut S. Leipner

383 Seiten, Hardcover

Kurzbeschreibung des Verlags

The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.

• Reihe: Springer Series in Solid-State Sciences
• Themen: Mathematik und Naturwissenschaften Physik Materialwissenschaft / Aggregatzustände Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik)
• ISBN: 9783540643715
• Sprache: Englisch
• Erscheinungsdatum: 21.01.1999
• Verlag: Springer Berlin