Progress in Transmission Electron Microscopy 1

Concepts and Techniques

367 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

• Reihe: Springer Series in Surface Sciences
• ISBN: 9783642087172
• Sprache: Englisch
• Erscheinungsdatum: 01.12.2010
• Genre: Technik/Maschinenbau, Fertigungstechnik
• Verlag: Springer Berlin
• Herausgegeben von: Xiao-Feng Zhang, Ze Zhang