Noncontact Atomic Force Microscopy

Volume 2

401 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

• Reihe: NanoScience and Technology
• ISBN: 9783642260704
• Sprache: Englisch
• Erscheinungsdatum: 14.03.2012
• Genre: Technik/Allgemeines, Lexika
• Verlag: Springer Berlin
• Herausgegeben von: Seizo Morita, Franz J. Giessibl, Roland Wiesendanger