Secondary Ion Mass Spectrometry SIMS V

Proceedings of the Fifth International Conference, Washington, DC, September 30 - October 4, 1985

592 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

I Retrospective.- II Fundamentals.- III Symposium: Detection of Sputtered Neutrals.- IV Detection Limits and Quantification.- V Instrumentation.- VI Techniques Closely Related to SIMS.- VII Combined Techniques and Surface Studies.- VIII Ion Microscopy and Image Analysis.- IX Depth Profiling and Semiconductor Applications.- X Metallurgical Applications.- XI Biological Applications.- XII Geological Applications.- XIII Symposium: Particle-Induced Emission from Organics.- XIV Organic Applications Including Fast Atom Bombardment Mass Spectrometry.- Index of Contributors.

• Reihe: Springer Series in Chemical Physics
• Themen: Mathematik und Naturwissenschaften Chemie Physikalische Chemie
• ISBN: 9783642827266
• Sprache: Englisch
• Erscheinungsdatum: 11.01.2012
• Größe: 235 x 155 mm
• Verlag: Springer Berlin Heidelberg
• Herausgegeben von: David S. Simons, Alfred Benninghoven, Helmut W. Werner, Richard J. Colton