Testing Sequence Dependent Defects

New Methods of Applying Two-pattern Tests and Testing Sequence Dependent Defects

von Narendra Devta-Prasanna

116 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.

• Themen: Technologie, Ingenieurswissenschaft, Landwirtschaft, Industrieprozesse Technologie, allgemein
• ISBN: 9783838312194
• Sprache: Englisch
• Erscheinungsdatum: 21.05.2010
• Größe: 220 x 150 mm
• Verlag: LAP LAMBERT Academic Publishing