Design, Analysis and Test of Logic Circuits Under Uncertainty

von Smita Krishnaswamy, Igor L. Markov, John P. Hayes

124 Seiten, Hardcover

Kurzbeschreibung des Verlags

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

• Reihe: Lecture Notes in Electrical Engineering
• Themen: Technologie, Ingenieurswissenschaft, Landwirtschaft, Industrieprozesse Elektronik, Nachrichtentechnik Elektronik Schaltkreise und Komponenten (Bauteile)
• ISBN: 9789048196432
• Sprache: Englisch
• Erscheinungsdatum: 21.09.2012
• Größe: 23.5 x 15.5 cm
• Verlag: Springer Netherland