Recent Interferometry Applications in Topography and Astronomy

232 Seiten, Hardcover

Kurzbeschreibung des Verlags

This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.

• Themen: Technologie, Ingenieurswissenschaft, Landwirtschaft, Industrieprozesse Maschinenbau und Werkstoffe Materialwissenschaft Technische Anwendung von elektronischen, magnetischen, optischen Materialien
• ISBN: 9789535104049
• Sprache: Englisch
• Erscheinungsdatum: 21.03.2012
• Größe: 266 x 185 mm
• Verlag: IntechOpen
• Herausgegeben von: Ivan Padron