Field Emission Scanning Electron Microscopy

New Perspectives for Materials Characterization

von Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

137 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

• Reihe: SpringerBriefs in Applied Sciences and Technology
• ISBN: 9789811044328
• Sprache: Englisch
• Erscheinungsdatum: 06.10.2017
• Genre: Technik/Maschinenbau, Fertigungstechnik
• Verlag: Springer Singapore