VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

815 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.

The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

• Reihe: Communications in Computer and Information Science
• ISBN: 9789811074691
• Sprache: Englisch
• Erscheinungsdatum: 22.12.2017
• Genre: Informatik, EDV/Hardware
• Verlag: Springer Singapore
• Herausgegeben von: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh