VLSI Design and Test

23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

775 Seiten, Taschenbuch

Kurzbeschreibung des Verlags

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

• Reihe: Communications in Computer and Information Science
• ISBN: 9789813297661
• Sprache: Englisch
• Erscheinungsdatum: 18.08.2019
• Genre: Informatik, EDV/Hardware
• Verlag: Springer Singapore
• Herausgegeben von: Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma