X-Ray Diffraction

Modern Experimental Techniques

444 Seiten, Hardcover

Kurzbeschreibung des Verlags

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

• Themen: Technologie, Ingenieurswissenschaft, Landwirtschaft, Industrieprozesse Energietechnik, Elektrotechnik und Energiemaschinenbau Elektrotechnik
• ISBN: 9789814303590
• Sprache: Englisch
• Erscheinungsdatum: 20.02.2015
• Größe: 231 x 155 mm
• Verlag: Jenny Stanford Publishing
• Herausgegeben von: Oliver H Seeck, Bridget Murphy